DOWSIL ME-6820

Harmonization Code : 3506.10.00.00 | Prepared glues and other prepared adhesives, not elsewhere specified or included; products suitable for use as glues or adhesives, put up for retail sale as glues or adhesives, not exceeding a net weight of 1 kg

DOWSIL ME6820

Main features

  • Low-Ionic Wire-Bond Encapsulation
  • 60-Minute Cure at 150 deg C
  • 18 kV/mm Dielectric Strength

Product Description

DOWSIL ME-6820 Microelectronic Encapsulant is a one-part black silicone elastomer encapsulant for wire-bond package die encapsulation and protection of sensitive components. Its addition-cure chemistry generates no byproducts during cure and uses a 60-minute heat cure at 150 deg C. The material has low ionic impurity levels and low modulus of elasticity. Typical cured properties include Shore A 52 hardness, 565 psi tensile strength, 40% elongation, and 730 psi unprimed die-shear adhesion on aluminum. Electrical data include 18 kV/mm dielectric strength and 3.2E15 ohm*cm volume resistivity.

Key features

  • About 6000 cP Encapsulant Viscosity: Typical as-supplied viscosity applies to the one-part encapsulant before heat cure.
  • 60-Minute Cure at 150 deg C: The listed heat-cure condition applies to the one-part encapsulant.
  • 18 kV/mm Dielectric Strength: Typical cured volume resistivity is about 3.2E15 ohm*cm.

Applications

Die encapsulation for wire-bond microelectronic packaging and protection of sensitive electronic structures.

Product Family

DOWSIL ME-6820

Catalog Product

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TDS, SDS & Technical Documents

Technical Specifications

General Properties
ColorColor
Black
Specific GravitySpecific Gravity
1.3
Physical Properties
ViscosityViscosity
6000 mPa.s
Mechanical Properties
ElongationElongation
40 %
Electrical Properties
Dielectric StrengthDielectric Strength
18 kV/mm
Volume ResistivityVolume Resistivity
3.2E+15 Ohms⋅cm

Additional Information

Technical properties

As-supplied / before-processing properties

PropertyValueUnitMethod / condition
Viscosity6000cPTypical
Heat cure time60min150 deg C; typical
Impurity, Na+0.2ppmTypical
Impurity, K+0.6ppmTypical
Impurity, Cl-1.4ppmTypical
Technical properties

After-processing / final-state properties

PropertyValueUnitMethod / condition
Durometer52Shore ACured; typical
Tensile strength565psiCured; typical
Elongation40%Cured; typical
Unprimed die-shear adhesion730psiAluminum substrate; typical
Dielectric strength18kV/mmTypical
Volume resistivity3.2E15ohm*cmTypical
Linear CTE225ppm/deg CTMA; typical

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